/**
 * Copyright (c) 2025 Huawei Technologies Co., Ltd.
 * This program is free software, you can redistribute it and/or modify it under the terms and conditions of
 * CANN Open Software License Agreement Version 2.0 (the "License").
 * Please refer to the License for details. You may not use this file except in compliance with the License.
 * THIS SOFTWARE IS PROVIDED ON AN "AS IS" BASIS, WITHOUT WARRANTIES OF ANY KIND, EITHER EXPRESS OR IMPLIED,
 * INCLUDING BUT NOT LIMITED TO NON-INFRINGEMENT, MERCHANTABILITY, OR FITNESS FOR A PARTICULAR PURPOSE.
 * See LICENSE in the root of the software repository for the full text of the License.
 */

#include "gtest/gtest.h"
#include <mockcpp/mockcpp.hpp>
#include <stdio.h>

#include "hccl/base.h"
#include <hccl/hccl_types.h>

#include "mem_device_pub.h"
#include "sal.h"
#include "adapter_rts.h"

using namespace std;
using namespace hccl;

class MemDeviceTest : public testing::Test
{
protected:
    static void SetUpTestCase()
    {
        std::cout << "\033[36m--MemDeviceTest SetUP--\033[0m" << std::endl;
    }
    static void TearDownTestCase()
    {
        std::cout << "\033[36m--MemDeviceTest TearDown--\033[0m" << std::endl;
    }
    // Some expensive resource shared by all tests.
    virtual void SetUp()
    {
        s32 portNum = 7;
        MOCKER(hrtGetHccsPortNum)
            .stubs()
            .with(mockcpp::any(), outBound(portNum))
            .will(returnValue(HCCL_SUCCESS));
        std::cout << "A Test SetUP" << std::endl;
    }
    virtual void TearDown()
    {
        std::cout << "A Test TearDown" << std::endl;
    }
};

TEST_F(MemDeviceTest, constructor_00)
{
    s32 ret = HCCL_SUCCESS;

    DeviceMem mem =  DeviceMem::alloc(8);
    EXPECT_EQ(ret, HCCL_SUCCESS);
}

TEST_F(MemDeviceTest, constructor_01)
{
    s32 ret = HCCL_SUCCESS;

    DeviceMem mem1 =  DeviceMem::alloc(8);
    DeviceMem mem2(mem1);
    EXPECT_EQ(ret, HCCL_SUCCESS);
}

TEST_F(MemDeviceTest, operate_equal)
{
    s32 ret = HCCL_SUCCESS;

    DeviceMem mem1 =  DeviceMem::alloc(8);
    DeviceMem mem2 = mem1;
    EXPECT_EQ(ret, HCCL_SUCCESS);
}

TEST_F(MemDeviceTest, create)
{
    s32 ret = HCCL_SUCCESS;
    void *ptr = NULL;
    DeviceMem mem;
    mem.create(ptr, 0);
    EXPECT_EQ(ret, HCCL_SUCCESS);
}

TEST_F(MemDeviceTest, range)
{
    s32 ret = HCCL_SUCCESS;
    DeviceMem test;
    DeviceMem mem1 =  DeviceMem::alloc(8);
    test = mem1.range(0, 4);
    EXPECT_EQ(ret, HCCL_SUCCESS);
}

TEST_F(MemDeviceTest, operate_equal_copy_assignment)
{
    s32 ret = HCCL_SUCCESS;

    DeviceMem mem1 ;
    DeviceMem mem0 = DeviceMem::alloc(8);
    mem1 = mem0;

    EXPECT_EQ(ret, HCCL_SUCCESS);
}

TEST_F(MemDeviceTest, alloc_fail)
{
    s32 ret = HCCL_SUCCESS;

    /*构造rt_malloc异常*/
    MOCKER(hrtMalloc)
    .expects(atMost(1))
    .will(returnValue(1));
    DeviceMem mem =  DeviceMem::alloc(8);
    GlobalMockObject::verify();
}

TEST_F(MemDeviceTest, free_fail)
{
    s32 ret = HCCL_SUCCESS;
    DeviceMem mem =  DeviceMem::alloc(8);

    /*构造rt_malloc异常*/
    MOCKER(hrtFree)
    .expects(atMost(1))
    .will(returnValue(1));
    mem.~ DeviceMem();
    GlobalMockObject::verify();
}